NDLI: Impact of a Dielectric Layer on the Resonant Conditions of Nanograting Structures

Content Provider	Springer Nature Link
Author	Niu, Chao Huang, Tiffany Zhang, Xin Liu, Haitao Zhang, Weihua Hu, Jonathan
Copyright Year	2014
Abstract	We study the resonant wavelength of nanograting structures covered by a dielectric medium. We find that the resonant wavelength oscillates as the thickness of the thin dielectric layer increases due to the cavity formed by the dielectric layer. The amplitude of this oscillation in the resonant wavelength is small when the minimum reflection occurs in the nanograting structure. For a plasmonic sensor covered by a dielectric medium, a small oscillation in the resonant wavelength as the thickness of the dielectric medium changes is preferred. We also study the impact of a rounded corner on the resonant wavelength and find that the rounded corners with a small radius of r effectively reduce the nanogroove depth by about 0.2 r. Results from the finite-difference time-domain (FDTD) method agree very well with the phase-matching condition, using parameters calculated from the rigorous coupled-wave analysis (RCWA) method. These results will lead to a better understanding of the accuracy of plasmonic sensors covered by dielectric media.
Starting Page	419
Ending Page	427
Page Count	9
File Format	PDF
ISSN	15571955
Journal	Plasmonics
Volume Number	10
Issue Number	2
e-ISSN	15571963
Language	English
Publisher	Springer US
Publisher Date	2014-11-23
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Nanostructures Metallic grating Surface plasmons Sensors Biotechnology Nanotechnology Biophysics and Biological Physics Biochemistry
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Biochemistry Biophysics Biotechnology

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