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| Content Provider | Springer Nature Link |
|---|---|
| Author | Zeng, FanGuang Li, Xin Liu, WeiHua Qiao, ShuZhen Ma, HuaLi Zhang, Rui Xia, LianSheng Chen, Yi Liu, XingGuang Zhang, Huang |
| Copyright Year | 2011 |
| Abstract | Carbon nanotube (CNT) films were grown on silicon wafers with and without a nickel layer (Si-CNT and Ni-CNT) via the pyrolysis of iron phthalocyanine. The nickel layer was prepared using the electroless plating method. To study the emission stability of Si-CNT and Ni-CNT cathodes during intense pulsed emission, emission characteristics were measured repeatedly with a diode structure using a Marx generator as a voltage source. For the peak values of the pulsed voltage, which were in the range between 1.62–1.66 MV (corresponding to electric field intensities between 11.57–11.85 V/μm), the first cycle emission current was 109.4 A for Si-CNT and 180.5 A for Ni-CNT. By comparing the normalized emission currents of the Si-CNT and Ni-CNT cathodes, the improvement in the emission stability can be easily quantified. The number of emission cycles necessary for the peak current to decay from 100% to 50% increased from ∼3 for Si-CNT to ∼11 for a Ni-CNT film. |
| Starting Page | 2379 |
| Ending Page | 2382 |
| Page Count | 4 |
| File Format | |
| ISSN | 10016538 |
| Journal | Chinese Science Bulletin |
| Volume Number | 56 |
| Issue Number | 22 |
| e-ISSN | 18619541 |
| Language | English |
| Publisher | SP Science China Press |
| Publisher Date | 2011-07-12 |
| Publisher Place | Heidelberg |
| Access Restriction | Subscribed |
| Subject Keyword | carbon nanotube nickel layer intense pulsed emission improved emission stability normalized current Earth Sciences Chemistry/Food Science Engineering Physics Life Sciences Science |
| Content Type | Text |
| Resource Type | Article |
| Subject | Multidisciplinary |
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