NDLI: Mechanical behavior study of microdevice and nanomaterials by Raman spectroscopy: a review

Content Provider	Springer Nature Link
Author	Qiu, Wei Kang, Yi Lan
Copyright Year	2014
Abstract	With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the micro-nano scale represents a new field of mechanical experiments. Raman spectroscopy, which is based on lattice dynamics theory, is applicable to the detection of the statistical information of the lattice structure deformation within the measuring points. Due to its peculiarities, such as non-destructiveness, convenience and high-resolution, this technology allows the on-line in situ measurement of residual stress in microstructures caused by processing and can also achieve the real-time deformation of graphene, carbon nanotubes and other nanomaterials under force loading. In recent years, mechanical measurements based on Raman spectroscopy technology have developed rapidly. In this review, Raman-based stress measurement theories for several commonly used materials are briefly described. Applications related to the residual stress measurements of microstructure and experimental investigations of the mechanical properties of low-dimensional nanomaterials are then reviewed. Finally, the development trend of this method is proposed.
Starting Page	2811
Ending Page	2824
Page Count	14
File Format	PDF
ISSN	10016538
Journal	Chinese Science Bulletin
Volume Number	59
Issue Number	23
e-ISSN	18619541
Language	English
Publisher	Science China Press
Publisher Date	2014-05-27
Publisher Place	Heidelberg
Access Restriction	Subscribed
Subject Keyword	Raman spectroscopy Residual stress in microdevice Mechanical property of nanomaterial Experimental mechanics Science Life Sciences Physics Chemistry/Food Science Earth Sciences Engineering
Content Type	Text
Resource Type	Article
Subject	Multidisciplinary

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