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| Content Provider | Springer Nature Link |
|---|---|
| Author | Fadeev, A. V. Rudenko, K. V. |
| Copyright Year | 2014 |
| Abstract | The few-view emission tomography (ET) of plasma, which introduces physical properties of objects into a reconstruction algorithm, requires a reliable experimental verification using independent methods for validating an adopted model of plasma inhomogeneities. The chosen test object—low-temperature argon plasma in a reactor with a remote plasma source—allows one to study the two-dimensional spatial distribution of a concentration of Ar$^{+}$ ions, which is calculated using the two-view ET, and to verify results using direct measurements by a Langmuir multiprobe located in the plane of tomographic scanning. Studies are carried out for the chamber pressure 2–12 mTorr; the sensitivity of the ion-field homogeneity to the external magnetic field is estimated. A close agreement between concentration fields of Ar$^{+}$, which are measured and reconstructed by tomography, is obtained. The divergence between the probe method and the ET data reconstruction with respect to two views is not above 10%. |
| Starting Page | 252 |
| Ending Page | 257 |
| Page Count | 6 |
| File Format | |
| ISSN | 10637397 |
| Journal | Russian Microelectronics |
| Volume Number | 43 |
| Issue Number | 4 |
| e-ISSN | 16083415 |
| Language | English |
| Publisher | Pleiades Publishing |
| Publisher Date | 2014-07-15 |
| Publisher Place | Moscow |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Electrical Engineering |
| Content Type | Text |
| Resource Type | Article |
| Subject | Materials Chemistry Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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