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| Content Provider | Springer Nature Link |
|---|---|
| Author | Zawadzka, A. Płóciennik, P. Strzelecki, J. |
| Copyright Year | 2013 |
| Abstract | The paper presents the photoluminescence investigation of zinc oxide thin films. A high quality ZnO films fabricated by dip-coating (sol–gel) method were grown on quartz wafers. The films with different thickness (number of layers) were annealed at different temperatures after the preparation process. It was found that high quality, transparent ZnO thin films could be produced on quartz substrates at relatively low annealing temperature (450–550 $$^{\circ }\mathrm{C}$$ ). The dependence of the ZnO thin film quality was studied by X-ray diffraction and atomic force microscopy techniques. Optical properties were investigated by classic and time-resolved photoluminescence (TRPL) measurements. Photoluminescence spectra allowed us to estimate energy of the free excitons, bond excitons and their longitudinal optical (LO) phonon replicas as a function of the annealing temperature. An innovative TRPL technique let us precisely measure the decay time of the free- and bond excitons’ in the real time. TRPL measurements as a function of temperature reveal a biexponential decay behavior with typical free/bound exciton decay constants of 970/5310 ps for the as-grown sample and 1380/5980 ps after annealing process. Presented spectra confirm high structural and optical quality of investigated films. We proved that the thermal treatment improve both optical and structural quality and extend the photoluminescence’s lifetimes. The obtained experimental results are important for identification of exciton’s peaks and their LO phonon replicas for the investigated ZnO films. |
| Starting Page | 87 |
| Ending Page | 101 |
| Page Count | 15 |
| File Format | |
| ISSN | 03068919 |
| Journal | Optical and Quantum Electronics |
| Volume Number | 46 |
| Issue Number | 1 |
| e-ISSN | 1572817X |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2013-06-18 |
| Publisher Place | Boston |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Zinc oxide Photoluminescence Dip-coating process Annealing process Exciton energy Exciton decay time Optics, Optoelectronics, Plasmonics and Optical Devices Electrical Engineering Characterization and Evaluation of Materials Computer Communication Networks |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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