NDLI: Ellipsometric Study of Superfluid Onset in Thin Liquid $^{4}$Helium Films

Content Provider	Springer Nature Link
Author	McMillan, T. Taborek, P. Rutledge, J. E.
Copyright Year	2004
Abstract	We have developed a modulated null ellipsometer capable of measuring single layers of adsorbed $^{4}$He films at 1.4 K. The small optical index of liquid helium, the extreme sensitivity to temperature gradients, and the requirement of sub-monolayer stability over many hours presents significant experimental challenges, which will be briefly discussed. The main goal of our experiments is to independently measure the superfluid and normal coverage in thin adsorbed $^{4}$He films. This is a particularly important issue for helium films on intermediate strength substrates such as rubidium and thin cesium, where previous measurements indicate that prewetting and the Kosterlitz-Thouless transition interact strongly, and the K-T transition appears to have nonuniversal features. Independent determination of the superfluid and normal fraction can be accomplished by using the ellipsometer in conjunction with a quartz crystal micro balance (QCM). QCM measurements rely on viscous coupling of the fluid layers, and therefore respond only to the normal component of a $^{4}$He film. In contrast, the ellipsometer is sensitive to the total thickness, independent of the state (superfluid or normal) of the film. By combining the QCM and ellipsometric measurements we can determine the total coverage, the normal fluid component and thus the superfluid fraction.
Starting Page	303
Ending Page	308
Page Count	6
File Format	PDF
ISSN	00222291
Journal	Journal of Low Temperature Physics
Volume Number	134
Issue Number	1-2
e-ISSN	15737357
Language	English
Publisher	Kluwer Academic Publishers-Plenum Publishers
Publisher Date	2004-01-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Characterization and Evaluation Materials Condensed Matter Magnetism, Magnetic Materials
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Materials Science

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