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  1. Journal of Materials Science: Materials in Electronics
  2. Journal of Materials Science: Materials in Electronics : Volume 15
  3. Journal of Materials Science: Materials in Electronics : Volume 15, Issue 2, February 2004
  4. Rectifying properties of poly(N-methylaniline)
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Journal of Materials Science: Materials in Electronics : Volume 28
Journal of Materials Science: Materials in Electronics : Volume 27
Journal of Materials Science: Materials in Electronics : Volume 26
Journal of Materials Science: Materials in Electronics : Volume 25
Journal of Materials Science: Materials in Electronics : Volume 24
Journal of Materials Science: Materials in Electronics : Volume 23
Journal of Materials Science: Materials in Electronics : Volume 22
Journal of Materials Science: Materials in Electronics : Volume 21
Journal of Materials Science: Materials in Electronics : Volume 20
Journal of Materials Science: Materials in Electronics : Volume 19
Journal of Materials Science: Materials in Electronics : Volume 18
Journal of Materials Science: Materials in Electronics : Volume 17
Journal of Materials Science: Materials in Electronics : Volume 16
Journal of Materials Science: Materials in Electronics : Volume 15
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 12, December 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 11, November 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 10, October 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 9, September 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 8, August 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 7, July 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 6, June 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 5, May 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 4, April 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 3, March 2004
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 2, February 2004
Electronic and optical properties of hydrogenated microcrystalline silicon: review
Charge conduction and photogeneration process in hybrid materials of conjugated polymer and dye-sensitized TiO$_{2}$ thin-film device
Effect of solid polymer electrolyte on the sensitization of photocurrents in solid-state electrochemical cells using conducting polypyrrole
Rectifying properties of poly(N-methylaniline)
Chemical mechanical polishing of tantalum: oxidizer and pH effects
Ion-implantation technology for improved GaAs MESFETs performance
Interfacial reactions and intermetallic compound growth between indium and copper
Nanopatterning of diamond films with composite oxide mask of metal octylates in electron beam lithography
Effect of inorganic binders on the properties of silver thick films
Effect of Sm$^{3+}$ ions on structural, dielectric, and electrical properties of Pb(SnTi)O$_{3}$ ceramics
1.02-μm vertical-cavity surface-emitting lasers with strain-compensated InGaAs quantum wells
Journal of Materials Science: Materials in Electronics : Volume 15, Issue 1, January 2004
Journal of Materials Science: Materials in Electronics : Volume 14
Journal of Materials Science: Materials in Electronics : Volume 13
Journal of Materials Science: Materials in Electronics : Volume 12
Journal of Materials Science: Materials in Electronics : Volume 11
Journal of Materials Science: Materials in Electronics : Volume 10
Journal of Materials Science: Materials in Electronics : Volume 9
Journal of Materials Science: Materials in Electronics : Volume 8

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Rectifying properties of poly(N-methylaniline)

Content Provider Springer Nature Link
Author Syed Abthagir, P. Saraswathi, R.
Copyright Year 2004
Abstract The electrical properties of various metal (Al/In/Sb/Sn)/poly(N-methylaniline)/gold Schottky diodes are described. The temperature-dependent dark current (J)–voltage (V ) characteristics indicate that the junctions formed with Al/In possess better rectifying properties with Schottky emission. In the case of junctions formed with Sb/Sn, Poole–Frenkel emission appears to be the dominant mechanism. The junction parameters of ideality factor, reverse saturation current, and barrier potential have been evaluated and compared with the reported values for Schottky barriers based on polyaniline and a few of its substituted derivatives. The capacitance (C)–voltage (V ) data obtained at different frequencies have been used to evaluate the carrier concentration, mobility, depletion width, contact potential, and work function of the polymer.
Starting Page 81
Ending Page 86
Page Count 6
File Format PDF
ISSN 09574522
Journal Journal of Materials Science: Materials in Electronics
Volume Number 15
Issue Number 2
e-ISSN 1573482X
Language English
Publisher Kluwer Academic Publishers
Publisher Date 2004-01-01
Publisher Place Boston
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Optical and Electronic Materials Characterization and Evaluation Materials
Content Type Text
Resource Type Article
Subject Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering
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