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  1. Journal of Materials Science: Materials in Electronics
  2. Journal of Materials Science: Materials in Electronics : Volume 13
  3. Journal of Materials Science: Materials in Electronics : Volume 13, Issue 7, July 2002
  4. Characterization of laser-ablated V$_{2}$O$_{5}$ thin films
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Journal of Materials Science: Materials in Electronics : Volume 28
Journal of Materials Science: Materials in Electronics : Volume 27
Journal of Materials Science: Materials in Electronics : Volume 26
Journal of Materials Science: Materials in Electronics : Volume 25
Journal of Materials Science: Materials in Electronics : Volume 24
Journal of Materials Science: Materials in Electronics : Volume 23
Journal of Materials Science: Materials in Electronics : Volume 22
Journal of Materials Science: Materials in Electronics : Volume 21
Journal of Materials Science: Materials in Electronics : Volume 20
Journal of Materials Science: Materials in Electronics : Volume 19
Journal of Materials Science: Materials in Electronics : Volume 18
Journal of Materials Science: Materials in Electronics : Volume 17
Journal of Materials Science: Materials in Electronics : Volume 16
Journal of Materials Science: Materials in Electronics : Volume 15
Journal of Materials Science: Materials in Electronics : Volume 14
Journal of Materials Science: Materials in Electronics : Volume 13
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 12, December 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 11, November 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 10, October 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 9, September 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 8, August 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 7, July 2002
Monolithic integration of III-V optical interconnects on Si using SiGe virtual substrates
Synthesis, characterization, and sintering of sol–gel derived cordierite ceramics for high-frequency MLCIs
Lithographic printing of force-sensitive resistors
Humidity sensing behaviors of nanocrystalline Al-doped ZnO thin films prepared by sol–gel process
Preparation and characterization of ordered yttrium arachidate multilayer
EPR in superconducting and nonsuperconducting Gd$_{0.02}$Y$_{0.98}$Ba$_{2}$Cu$_{3}$O$_{7−δ}$. Resolved and unresolved fine structure of Gd$^{3+}$
Influence of heat treatment on the optical properties of SnO$_{2}$ : Sb thin films deposited by dip coating using aqueous solution
Influence of the oxygen adsorbed on tin varistors doped with Co, Mn and Cr oxides
Low-fired microwave dielectrics in ZnO-TiO$_{2}$ ceramics doped with CuO and B$_{2}$O$_{3}$
Study on microstructure and magnetic domain structure in sputtered (Ni$_{66}$Fe$_{22}$Co$_{12}$)$_{ x }$C$_{1−x }$ nanocomposite films
Characterization of laser-ablated V$_{2}$O$_{5}$ thin films
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 6, June 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 5, May 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 4, April 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 3, March 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 2, February 2002
Journal of Materials Science: Materials in Electronics : Volume 13, Issue 1, January 2002
Journal of Materials Science: Materials in Electronics : Volume 12
Journal of Materials Science: Materials in Electronics : Volume 11
Journal of Materials Science: Materials in Electronics : Volume 10
Journal of Materials Science: Materials in Electronics : Volume 9
Journal of Materials Science: Materials in Electronics : Volume 8

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Characterization of laser-ablated V$_{2}$O$_{5}$ thin films

Content Provider Springer Nature Link
Author Madhuri, K. V. Rao, K. S. Naidu, B. S. Hussain, O. M. Pinto, R.
Copyright Year 2002
Abstract Vanadium pentoxide thin films have been prepared by the pulsed laser deposition technique. The influence of substrate temperature on the growth of V$_{2}$O$_{5}$ films was studied. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and atomic force microscopy (AFM) measurements have been carried out in order to understand the growth mechanism. The crystallization in V$_{2}$O$_{5}$ thin films starts at deposition temperatures as low as 473 K and the grain size increased with deposition temperature. The films exhibited predominantly (0 0 1) orientation, representing the orthorhombic layered structure. The infrared (IR) and Raman measurements supported the above data.
Starting Page 425
Ending Page 432
Page Count 8
File Format PDF
ISSN 09574522
Journal Journal of Materials Science: Materials in Electronics
Volume Number 13
Issue Number 7
e-ISSN 1573482X
Language English
Publisher Kluwer Academic Publishers
Publisher Date 2002-01-01
Publisher Place Boston
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Optical and Electronic Materials Characterization and Evaluation Materials
Content Type Text
Resource Type Article
Subject Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering
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