NDLI: Dielectric permittivity and loss of CaCu$_{3}$Ti$_{4}$O$_{12}$ (CCTO) substrates for microwave devices and antennas

Content Provider	Springer Nature Link
Author	Kretly, L. C. Almeida, A. F. L. Fechine, P. B. A. de Oliveira, R. S. Sombra, A. S. B.
Copyright Year	2004
Abstract	The solid state procedure was used to produce bulk ceramics of CCTO (CaCu$_{3}$Ti$_{4}$O$_{12}$). The samples of the CCTO ceramic were studied by X-ray powder diffraction, infrared and Raman scattering spectroscopy. The infrared and Raman scattering spectroscopy confirm the formation of the CCTO phase as seen by X-ray diffraction analysis. For one experimental procedure one uses an organic binder in the process of shaping the samples. In the second procedure the samples were prepared without the presence of the organic phase. For the second situation, we had higher dielectric constant (ɛ$_{ r }$=7370) with high loss (D=0.2) at 1 KHz. For the first procedure one has the lower dielectric constant (ɛ$_{ r }$=1530) and lower loss (D=0.11) at 1 KHz. Simple rectangular antenna prototypes were also designed on substrate samples (C1, C2, P1 and P2). For the antennas (with P2, C1 and C2 as substrates), the bandwidth (BW) is 90 MHz (around 3%). The antenna with P1 substrate presented a surprisingly high BW of 270 MHz that corresponds to a 10% bandwidth. In the microwave range one observes that higher values of the ɛ$_{ r }$ in the range of 3 GHz antennas is also presented by the P1 sample (ɛ$_{ r }$=41.6), and the lowest one was presented by P2 (ɛ$_{ r }$=33.7). Sample P1 also presents the highest value for the loss (Q $^{−1}$) which is around 0.1 compared to the other samples which is around 0.03. Therefore, these measurements confirm the potential use for small high dielectric planar antennas. These materials are also attractive for capacitor applications and certainly for microelectronics, and microwave devices (e.g., cell mobile phones), where the miniaturization of the devices is crucial.
Starting Page	657
Ending Page	663
Page Count	7
File Format	PDF
ISSN	09574522
Journal	Journal of Materials Science: Materials in Electronics
Volume Number	15
Issue Number	10
e-ISSN	1573482X
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2004-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Optical and Electronic Materials Characterization and Evaluation Materials
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Giant dielectric, low dielectric loss, and non-ohmic properties of nanocrystalline CaCu$_{3}$Ti$_{4}$O$_{12}$

Structural and electrical study of CaCu$_{3}$Ti$_{4}$O$_{12}$ (CCTO) obtained in a new ceramic procedure

Effect of CaCu$_{3}$Ti$_{4}$O$_{12}$ powders prepared by the different synthetic methods on dielectric properties of CaCu$_{3}$Ti$_{4}$O$_{12}$/polyvinylidene fluoride composites

Sintering behavior and dielectric properties of polycrystalline CaCu$_{3}$Ti$_{4}$O$_{12}$

CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics from different methods: microstructure and dielectric

Dielectric response of Sb-doped CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics

Dielectric properties of CaCu$_{3}$Ti$_{4}$O$_{12}$–silicone rubber composites

Influences of CuAl$_{2}$O$_{4}$ doping on the dielectric properties of CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics

Microstructural and dielectric properties of donor doped (La$^{3+}$) CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics

Dielectric permittivity and loss of CaCu$_{3}$Ti$_{4}$O$_{12}$ (CCTO) substrates for microwave devices and antennas

Similar Documents

Giant dielectric, low dielectric loss, and non-ohmic properties of nanocrystalline CaCu$_{3}$Ti$_{4}$O$_{12}$

Structural and electrical study of CaCu$_{3}$Ti$_{4}$O$_{12}$ (CCTO) obtained in a new ceramic procedure

Effect of CaCu$_{3}$Ti$_{4}$O$_{12}$ powders prepared by the different synthetic methods on dielectric properties of CaCu$_{3}$Ti$_{4}$O$_{12}$/polyvinylidene fluoride composites

Sintering behavior and dielectric properties of polycrystalline CaCu$_{3}$Ti$_{4}$O$_{12}$

CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics from different methods: microstructure and dielectric

Dielectric response of Sb-doped CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics

Dielectric properties of CaCu$_{3}$Ti$_{4}$O$_{12}$–silicone rubber composites

Influences of CuAl$_{2}$O$_{4}$ doping on the dielectric properties of CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics

Microstructural and dielectric properties of donor doped (La$^{3+}$) CaCu$_{3}$Ti$_{4}$O$_{12}$ ceramics

Dielectric permittivity and loss of CaCu$_{3}$Ti$_{4}$O$_{12}$ (CCTO) substrates for microwave devices and antennas