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  1. Journal of Materials Science: Materials in Electronics
  2. Journal of Materials Science: Materials in Electronics : Volume 16
  3. Journal of Materials Science: Materials in Electronics : Volume 16, Issue 10, October 2005
  4. Optical nonlinearity in photonic glasses
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Journal of Materials Science: Materials in Electronics : Volume 28
Journal of Materials Science: Materials in Electronics : Volume 27
Journal of Materials Science: Materials in Electronics : Volume 26
Journal of Materials Science: Materials in Electronics : Volume 25
Journal of Materials Science: Materials in Electronics : Volume 24
Journal of Materials Science: Materials in Electronics : Volume 23
Journal of Materials Science: Materials in Electronics : Volume 22
Journal of Materials Science: Materials in Electronics : Volume 21
Journal of Materials Science: Materials in Electronics : Volume 20
Journal of Materials Science: Materials in Electronics : Volume 19
Journal of Materials Science: Materials in Electronics : Volume 18
Journal of Materials Science: Materials in Electronics : Volume 17
Journal of Materials Science: Materials in Electronics : Volume 16
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 11-12, November 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 10, October 2005
Optical nonlinearity in photonic glasses
Effect of the plasma surface treatment on an anatase TiO$_{2}$ film
Physical properties of natively textured yttrium doped zinc oxide films by sol-gel
Optical, structural and electrical characteristics of aluminum oxynitride thin films deposited in an Ar-N gas mixture RF-sputtering system
Improved dielectric properties in pyrochlore type oxides: Ca$_{3}$Sm$_{3−x}$Bi$_{x}$Ti$_{7}$Nb$_{2}$O$_{26.5}$ (x = 1.0, 2.0 or 3.0) by Bi substitution
Dielectric properties of Be(IO$_{3}$)$_{2}$⋅4H$_{2}$O crystals
Influence of 3d-elements on dielectric properties of BaTiO$_{3}$ ceramics
On the use of a neural network to characterize the plasma etching of SiON thin films
Study on pore-forming agents in processing of porous piezoceramics
Structural and electrical properties of perovskite ruthenate-based lead-free thick film resistors on alumina and LTCC
Microstructural damage analysis of SnAgCu solder joints and an assessment on indentation procedures
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 9, September 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 8, August 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 7, July 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 6, June 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 5, May 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 4, April 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 3, March 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 2, February 2005
Journal of Materials Science: Materials in Electronics : Volume 16, Issue 1, January 2005
Journal of Materials Science: Materials in Electronics : Volume 15
Journal of Materials Science: Materials in Electronics : Volume 14
Journal of Materials Science: Materials in Electronics : Volume 13
Journal of Materials Science: Materials in Electronics : Volume 12
Journal of Materials Science: Materials in Electronics : Volume 11
Journal of Materials Science: Materials in Electronics : Volume 10
Journal of Materials Science: Materials in Electronics : Volume 9
Journal of Materials Science: Materials in Electronics : Volume 8

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Optical nonlinearity in photonic glasses

Content Provider Springer Nature Link
Author Tanaka, Keiji
Copyright Year 2005
Abstract A brief review on optical nonlinearity in photonic glasses is given. For the third-order, relationship between two-photon absorption and nonlinear refractive-index is considered using a formalism developed for crystalline semiconductors. Stimulated light scattering and super-continuum generation in optical fibers are also introduced. Prominent resonant-type nonlinearity in particle-embedded glasses is described. For the second-order, a variety of poling methods are summarized. Finally, it is pointed out that different photoinduced changes can appear when excited by linear and nonlinear optical processes, and the feature is related with glass structures.
Starting Page 633
Ending Page 643
Page Count 11
File Format PDF
ISSN 09574522
Journal Journal of Materials Science: Materials in Electronics
Volume Number 16
Issue Number 10
e-ISSN 1573482X
Language English
Publisher Kluwer Academic Publishers
Publisher Date 2005-01-01
Publisher Place Boston
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Characterization and Evaluation Materials Optical and Electronic Materials
Content Type Text
Resource Type Article
Subject Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering
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