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| Content Provider | Springer Nature Link |
|---|---|
| Author | Yavuz, Şeyda Bilgili, Özlem Kocabaş, Kemal |
| Copyright Year | 2016 |
| Abstract | In this work, nano-SnO$_{2}$ (<100 nm) added samples in Bi$_{1.7−x}$Pb$_{0.3}$Sn$_{x}$Sr$_{2}$Ca$_{2}$Cu$_{3}$O$_{y}$ (x = 0.00–0.20) were prepared by conventional solid-state reaction method. The phase formation, volume fraction and lattice parameters were characterized using X-ray powder diffraction measurements. Surface morphology and grain connectivity of the samples were identified by using scanning electron microscope (SEM). Diamagnetic onset temperatures (T c on ) and hole concentration (p) of SnO$_{2}$ added samples were determined by ac susceptibiliy measurements. AC susceptibility measurements showed that diamagnetic onset temperatures (T c on ) of samples Sn0 (x = 0.00), Sn1 (x = 0.05), Sn2 (x = 0.10), Sn3 (x = 0.15) and Sn4 (x = 0.20) are 108.559, 109.985, 101.281, 101.670 and 92.676 K, respectively. SEM measurements showed that not only the surface morphology and grain connectivity degrade but also the grain size of the samples decrease with the increase of the Sn addition. Also, addition of SnO$_{2}$ nanoparticles increases the impurities, voids and porosity. X-ray diffraction patterns of all samples indicated the majority of Bi-2223 and Bi-2212 phases along with minor impurity phase Ca$_{2}$PbO$_{4}$. The volume fraction of the Bi-2223 phase for the sample with x = 0.10 SnO$_{2}$ showed the highest percentage (49.49) and with further increasing SnO$_{2}$, the volume fraction of the Bi-2223 phase decreases and Bi-2212 phase increases. All SnO$_{2}$ nanoparticles added samples showed quite similar lattice parameters compared with non-added sample. These results indicate that nano SnO$_{2}$ does not have significant impact on the lattice parameters. |
| Starting Page | 4526 |
| Ending Page | 4533 |
| Page Count | 8 |
| File Format | |
| ISSN | 09574522 |
| Journal | Journal of Materials Science: Materials in Electronics |
| Volume Number | 27 |
| Issue Number | 5 |
| e-ISSN | 1573482X |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2016-02-02 |
| Publisher Place | New York |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Optical and Electronic Materials Characterization and Evaluation of Materials |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering |
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