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  1. Journal of Materials Science: Materials in Electronics
  2. Journal of Materials Science: Materials in Electronics : Volume 17
  3. Journal of Materials Science: Materials in Electronics : Volume 17, Issue 5, May 2006
  4. Characteristics of pulse plated ZnTe films
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Journal of Materials Science: Materials in Electronics : Volume 28
Journal of Materials Science: Materials in Electronics : Volume 27
Journal of Materials Science: Materials in Electronics : Volume 26
Journal of Materials Science: Materials in Electronics : Volume 25
Journal of Materials Science: Materials in Electronics : Volume 24
Journal of Materials Science: Materials in Electronics : Volume 23
Journal of Materials Science: Materials in Electronics : Volume 22
Journal of Materials Science: Materials in Electronics : Volume 21
Journal of Materials Science: Materials in Electronics : Volume 20
Journal of Materials Science: Materials in Electronics : Volume 19
Journal of Materials Science: Materials in Electronics : Volume 18
Journal of Materials Science: Materials in Electronics : Volume 17
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 12, December 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 11, November 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 10, October 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 9, September 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 8, August 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 7, July 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 6, June 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 5, May 2006
Electrical characteristics of ZrN metallised metal-oxide-semiconductor and metal-insulator-metal devices
The Effect of flux types on the formation of green light emitting phosphor particles with spherical shape and filled morphology
Dielectric properties of BSTO/MgO ceramic composites
Submicron size Li(Ni$_{1/3}$Co$_{1/3}$Mn$_{1/3}$)O$_{2}$ particles prepared by spray pyrolysis from polymeric precursor solution
Synthesis and characterization of nm-sized PbTiO$_{3}$ crystallites
Silver hexacyanoferrate/conducting polymer composite
Effects of activation temperature on the electrochemical capacitance of activated carbon nanotubes
Investigation of microstructures and tensile properties of a Sn-Cu lead-free solder alloy
All-optical polarization-independent diffraction in dye-doped cholesteric liquid crystal
Characteristics of pulse plated ZnTe films
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 4, April 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 3, March 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 2, February 2006
Journal of Materials Science: Materials in Electronics : Volume 17, Issue 1, January 2006
Journal of Materials Science: Materials in Electronics : Volume 16
Journal of Materials Science: Materials in Electronics : Volume 15
Journal of Materials Science: Materials in Electronics : Volume 14
Journal of Materials Science: Materials in Electronics : Volume 13
Journal of Materials Science: Materials in Electronics : Volume 12
Journal of Materials Science: Materials in Electronics : Volume 11
Journal of Materials Science: Materials in Electronics : Volume 10
Journal of Materials Science: Materials in Electronics : Volume 9
Journal of Materials Science: Materials in Electronics : Volume 8

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Characteristics of pulse plated ZnTe films

Content Provider Springer Nature Link
Author Murali, K. R. Rajkumar, P. Richards
Copyright Year 2006
Abstract Stoichiometric films of ZnTe are electrodeposited on stainless steel and conducting glass substrates from an aqueous solution consisting of ZnSO$_{4}$ (50 mM), TeO$_{2}$ (17 μM) and H$_{2}$SO$_{4}$ to maintain a pH of 2.5. Structure, morphology, composition, and optical are studied using XRD, SEM, EDAX and optical transmittance spectroscopy The films are composed of small crystallites (50 nm) with cubic crystal structure. The films were polycrystalline in nature with peaks corresponding to the cubic phase. Direct band gap of 2.30 eV was observed. XPS studiers indicated the formation of ZnTe. EDAX measurements were made on the films and it was found that there was a slight excess of Te. AFM studies indicated a surface roughness of 15 nm and a crystallite size of 10–50 nm.
Starting Page 393
Ending Page 396
Page Count 4
File Format PDF
ISSN 09574522
Journal Journal of Materials Science: Materials in Electronics
Volume Number 17
Issue Number 5
e-ISSN 1573482X
Language English
Publisher Kluwer Academic Publishers
Publisher Date 2006-01-01
Publisher Place Boston
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Characterization and Evaluation Materials Optical and Electronic Materials
Content Type Text
Resource Type Article
Subject Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering
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