NDLI: X-ray diffraction from quantum wires and quantum dots

Content Provider	Springer Nature Link
Author	Zhuang, Y. Stangl, J. Darhuber, A. A. Bauer, G. Mikuli´k, P. Holy´, V. Darowski, N. Pietsch, U.
Copyright Year	1999
Abstract	From the distribution of the scattered intensity in reciprocal space, information on the shape as well as on the strain distribution in nanostructured samples can be obtained. This is exemplified by applying this method to laterally patterned periodic Si/SiGe superlattices as well as to periodic SiGe dot arrays embedded in Si.
Starting Page	215
Ending Page	221
Page Count	7
File Format	PDF
ISSN	09574522
Journal	Journal of Materials Science: Materials in Electronics
Volume Number	10
Issue Number	3
e-ISSN	1573482X
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	1999-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Optical and Electronic Materials Characterization and Evaluation Materials
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering

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X-ray diffraction from quantum wires and quantum dots