NDLI: Review Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis

Content Provider	Springer Nature Link
Author	Baba Kishi, K. Z.
Copyright Year	2002
Abstract	The technique of electron backscatter Kikuchi diffraction patterns (BKDPs) in the scanning electron microscope is reviewed. The paper focuses mainly on the crystallographic applications of the technique, including discussions on point group and space group determination and strain analysis. Orientation microscopy is discussed but not reviewed. The geometrical configurations of BKDPs are reviewed in detail and the relationship between BKDPs and the technique of electron channelling patterns (ECPs) is explored briefly. Essential crystallography is discussed and methods of analysis of BKDPs to extract crystallographic information are analyzed in detail. Some important characteristics of diffraction contrast in BKDPs are analyzed with respect to the geometry of the technique, the dynamical theory of electron diffraction and crystallographic applications. Examples of the use of theoretical contrast in pattern interpretation are provided. Anomalous effects in BKDPs are analyzed in detail and ways of identifying anomalous contrast in practice are discussed. BKDPs included in the paper are zincblende (ZnS), silicon, germanium, GaAs, chalcopyrite (CuFeS$_{2}$, TaTe$_{4}$ and Er$_{2}$Ge$_{2}$O$_{7}$.
Starting Page	1715
Ending Page	1746
Page Count	32
File Format	PDF
ISSN	00222461
Journal	Journal of Materials Science
Volume Number	37
Issue Number	9
e-ISSN	15734803
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2002-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Polymer Sciences Industrial Chemistry/Chemical Engineering Characterization and Evaluation Materials Mechanics
Content Type	Text
Resource Type	Article
Subject	Ceramics and Composites Mechanics of Materials Mechanical Engineering Polymers and Plastics

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