NDLI: Determining Aliasing Probabilities in BIST by Counting Strings

Content Provider	Springer Nature Link
Author	Byrne, Rodrigue
Copyright Year	1997
Abstract	The aliasing probability (AP) of a Built-In Self-Test (BIST)architecture is the probability that an error response gets classified as agood response. A general technique to determine the AP for many common andalternative BIST response analysis (RA) architectures is presented here.This technique models the RA circuit as a Deterministic Finite Automaton(DFA), and determines the AP by counting the ratio of strings accepted bythe DFA to the total number of possible error strings. The strings acceptedby a DFA can be calculated by counting the paths in the DFA‘s statetransition graph (STG). Moreover, if the STG is complete, then theAP(k) = ((1/N)N$^{k}$-1)/(N$^{k}$-1), where k is the testlength and N is the number of states and input symbols. Thistechnique is demonstrated by determining the APs for the following RAarchitectures: Multiple-Input Shift Registers (MISRs), Cellular Automata(CA), Linear Feedback Shift Registers (LFSRs), accumulators, and a set ofalternative architectures directly based on DFAs. This paper also shows howthe adjacency matrix of the STG can be used to directly determine the AP ofany RA architecture modeled as a DFA. Finally, the eigenvalues andeigenvectors of the DFA‘s STG adjacency matrix are used to derive generalexpressions for the DFA‘s AP.
Starting Page	263
Ending Page	272
Page Count	10
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	11
Issue Number	3
e-ISSN	15730727
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	1997-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Computer-Aided Engineering (CAD, CAE) and Design Electronic and Computer Engineering
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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