NDLI: A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

Content Provider	Springer Nature Link
Author	Yang, ChengLin Tian, ShuLin Long, Bing Chen, Fang
Copyright Year	2010
Abstract	Most of the recently reported test point selection algorithms for analog fault dictionary techniques are based on integer-coded table (ICT) technique. Hence, the accuracy of these algorithms is closely related to the accuracy of the ICT technique. Unfortunately, this technique is not accurate, especially when the size of fault dictionary is large. This paper proposes an accurate fault-pair Boolean table technique for the test point selection problem. First, the approach to transform the fault dictionary into a fault-pair Boolean table is introduced. Then, a test point selection algorithm based on the fault-pair Boolean table is proposed. Thirdly, several example circuits are used to illustrate the proposed algorithm. Simulated results indicate that the proposed method is more accurate than the other methods. Therefore, it is a good solution for minimizing the size of the test point set.
Starting Page	523
Ending Page	534
Page Count	12
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	26
Issue Number	5
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2010-09-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Analog fault dictionary Integer-coded table Fault-pair Boolean table Test points selection Fault diagnosis Computer-Aided Engineering (CAD, CAE) and Design Electrical Engineering Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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