NDLI: Test Generation for Mixed-Signal Devices Using Signal Flow Graphs

Content Provider	Springer Nature Link
Author	Ramadoss, Rajesh Bushnell, Michael L.
Copyright Year	1999
Abstract	We describe a new reverse simulation approach to analog and mixed-signal circuit test generation that parallels digital test generation. We invert the analog circuit signal flow graph, reverse simulate it with good and bad machine outputs, and obtain test waveforms and component tolerances, given circuit output tolerances specified by the functional test needs of the designer. The inverted graph allows backtracing to justify analog outputs with analog input sinusoids. Mixed-signal circuits can be tested using this approach, and we present test generation results for two mixed-signal circuits and four analog circuits, one being a multiple-input, multiple-output circuit. This analog backtrace method can generate tests for second-order analog circuits and certain non-linear circuits. These cannot be handled by existing methods, which lack a fault model and a backtrace method. Our proposed method also defines the necessary tolerances on circuit structural components, in order to keep the output circuit signal within the envelope specified by the designer. This avoids the problem of overspecifying analog circuit component tolerances, and reduces cost. We prove that our parametric fault tests also detect all catastrophic faults. Unlike prior methods, ours is a structural, rather than functional, analog test generation method.
Starting Page	189
Ending Page	205
Page Count	17
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	14
Issue Number	3
e-ISSN	15730727
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	1999-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Computer-Aided Engineering (CAD, CAE) and Design Electronic and Computer Engineering Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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