NDLI: A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting

Content Provider	Springer Nature Link
Author	Rolíndez, Luis Mir, Salvador Bounceur, Ahcéne Carbonéro, Jean Louis
Copyright Year	2006
Abstract	Sigma–Delta (ΣΔ) modulators have made possible the design of high-resolution Analogue-to-Digital Converters (ADCs) with relaxed analogue circuitry precision by moving most of the design complexity to the digital domain. However, testing these ΣΔ ADCs is becoming a costly task due to trends towards high-resolution implementations and associated increase in samples required to extract key specifications. In this paper, we propose a Built-In Self-Test (BIST) technique for high-resolution ΣΔ ADCs. The technique, mostly digital, moves most of the test complexity to the digital domain, that is in-line with the philosophy of ΣΔ modulation. Both the test signal generation and the output response analysis are performed on-chip. The stimulus, a sinusoid encoded in a binary bit stream, is chosen to have very high quality in the bandwidth of the converter with the quantization error laying outside of the analogue modulator’s bandwidth. For the output response analysis, a sine-wave fitting algorithm is implemented on chip. For this, a digital sinusoidal stimulus of a very high precision is needed as a reference signal. In this paper, we generate this reference signal from the same input stimulus, by passing it through the digital filter already existing in the converter. Simulations results show the capability of this technique to obtain measurements of the SNDR (Signal-to-Noise-plus-Distortion Ratio) for a 16-bit audio ΣΔ ADC.
Starting Page	325
Ending Page	335
Page Count	11
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	22
Issue Number	4-6
e-ISSN	15730727
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2007-01-18
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	analogue BIST analogue-to-digital converter mixed-signal testing sigma–delta modulation Computer-Aided Engineering (CAD, CAE) and Design Electronic and Computer Engineering Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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