NDLI: A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance

Content Provider	Springer Nature Link
Author	Han, Han Wang, Houjun Tian, Shulin Zhang, Na
Copyright Year	2012
Abstract	This paper presents a new analog circuit fault diagnosis method based on improved Mahalanobis Distance. The Mahalanobis Distance is improved according to the characteristics of analog circuit, and then introduced into analog circuit fault detection. First, the circuit testability was analyzed, and the relation of ambiguity groups was determined on the basis of the test matrix, and then the separable potential faulty components under the assumption of single fault were also determined. Finally, the suspicious components could be classified using the improved Mahalanobis Distance according to the feature values of the test points, so as to reduce the number of classes and enhance the speed when classifying faults. The experiment shows that the method can achieve fast analog circuit fault diagnosis and better results of analog circuit diagnosis detection.
Starting Page	95
Ending Page	102
Page Count	8
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	29
Issue Number	1
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2012-12-21
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Analog circuits Fault diagnosis Testability Mahalanobis distance Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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