NDLI: Detection of Defects Using Fault Model Oriented Test Sequences

Content Provider	Springer Nature Link
Author	Revell, M. Azaïs, F. Bertrand, Y.
Copyright Year	1999
Abstract	This paper analyzes the possibilities and limitations of defect detection using fault model oriented test sequences. The analysis is conducted through the example of a short defect considering the static voltage test technique. Firstly, the problem of defect excitation and effect propagation is studied. It is shown that the effect can be either a defective effect or a defect-free effect depending on the value of unpredictable parameters. The concept of ‘Analog Detectability Interval’ (ADI) is used to represent the range of the unpredictable parameters creating a defective effect. It is demonstrated that the ADIs are pattern dependent. New concepts (‘Global ADI’, ‘Covered ADI’) are then proposed to optimize the defect detection taking into account the unpredictable parameters. Finally, the ability of a fault oriented test sequence to detect defect is discussed. In particular, it is shown that the test sequence generated to target the stuck-at faults can reasonably guarantee short defect detection till a limit given by the Analog Detectability Intervals.
Starting Page	13
Ending Page	22
Page Count	10
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	14
Issue Number	1-2
e-ISSN	15730727
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	1999-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Computer-Aided Engineering (CAD, CAE) and Design Electronic and Computer Engineering Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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