NDLI: Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

Content Provider	Springer Nature Link
Author	Park, Joonsung Shin, Hongjoong Abraham, Jacob A.
Copyright Year	2011
Abstract	This paper presents new test methods for nonlinear Analog and Mixed-Signal (AMS) circuits which use a pseudorandom signal to test multiple Devices Under Test (DUTs) accurately. The goal of the studies presented in this paper is to understand the behaviors of nonlinear AMS circuits in a low-cost test environment and to develop the algorithm to extract the performance information of the DUTs using simple test measurements. The extracted information is then used to estimate the various specifications of DUTs. In order to achieve this goal, we analyze the behaviors of AMS circuits using a Volterra series model, and investigate the stochastic properties of the pseudorandom signals to develop the efficient performance characterization algorithms. The mathematical theory and experimental results are presented to validate the presented test methods.
Starting Page	321
Ending Page	334
Page Count	14
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	27
Issue Number	3
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2011-05-31
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Analog and mixed-signal test Pseudorandom test Parallel test System-on-a-chip test Computer-Aided Engineering (CAD, CAE) and Design Electrical Engineering Circuits and Systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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