NDLI: An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency

Content Provider	Springer Nature Link
Author	Wu, Minshun Chen, Degang Duan, Jingbo
Copyright Year	2012
Abstract	An accurate and cost-effective jitter measurement technique is proposed. The new technique uses only a single test with a high frequency input sine wave. Eliminating the need for a 2nd low frequency test, which is required in the conventional dual-frequency jitter test, provides significantly savings in both hardware and data acquisition time. The new technique is computationally efficient since it requires only one FFT together with some simple time domain computation. Furthermore, there are no nonlinear operations involved, hence avoiding errors inherently associated with such operations. Theoretical analysis, extensive simulation results and experimental results show that the proposed technique is cost-effective and achieves comparable test accuracy to that achieved by the conventional dual-frequency test. The new technique is reliable and robust to both harmonic and non-harmonic distortions. The algorithmic simplicity and the relaxed hardware requirement make the new technique potentially suited for built-in self test.
Starting Page	733
Ending Page	743
Page Count	11
File Format	PDF
ISSN	09238174
Journal	Journal of Electronic Testing
Volume Number	28
Issue Number	5
e-ISSN	15730727
Language	English
Publisher	Springer US
Publisher Date	2012-07-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Analog-to-digital converter (ADC) Fast Fourier transform (FFT) Jitter Spectral testing Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design Electrical Engineering
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling

Testing ADC Spectral Performance Without Dedicated Data Acquisition

A First Step for an INL Spectral-Based BIST: The Memory Optimization

Fast & accurate algorithm for jitter test with a single frequency test signal

Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform

Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction

ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus

Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency

Similar Documents

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling

Testing ADC Spectral Performance Without Dedicated Data Acquisition

A First Step for an INL Spectral-Based BIST: The Memory Optimization

Fast & accurate algorithm for jitter test with a single frequency test signal

Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform

Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction

ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus

Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency