NDLI: The Effect of Stress on the Microwave Dielectric Properties of Ba$_{0.5}$Sr$_{0.5}$TiO$

Content Provider	Springer Nature Link
Author	Horwitz, James S. Chang, Wontae Kim, Wonjeong Qadri, Syed B. Pond, Jeffrey M. Kirchoefer, Steven W. Chrisey, Douglas B.
Copyright Year	2000
Abstract	Single phase, (1 0 0) epitaxial Ba$_{0.5}$Sr$_{0.5}$TiO$_{3}$ (BST) films have been deposited onto (1 0 0) LaAlO$_{3}$ and MgO substrates by pulsed laser deposition (PLD). The capacitance and dielectric losses of as-deposited and annealed films have been measured from 1–20 GHz as a function of electric field (0–80 kV/cm) at room temperature. The dielectric properties are strongly affected by the substrate type, post-deposition annealing time (≤6 h) and temperature (≤1200°C). For epitaxial BST films deposited onto MgO, it is observed that, after a post-deposition anneal the dielectric constant and the dielectric loss decreases. For epitaxial BST films deposited onto LAO, a post-deposition anneal (≤1000°C) results in an increase in the dielectric constant and an increase in the dielectric loss. The dc electric field induced change in the dielectric constant tends to increase with the dielectric constant and is largest for as-deposited films on MgO and post-deposited annealed films on LAO. In general, for epitaxial BST films, a large electric field effect is observed in films that have a large dielectric loss and a small electric field effect in films that have a low dielectric loss. High resolution X-ray diffraction measurements indicate that deposited film exhibit a significant tetragonal distortion which is strongly affected by a by a post deposition anneal. The observed differences in dielectric properties of the epitaxial BST films on MgO and LAO are attributed to the differences in film stress which arise as a consequence of the lattice mismatch between the film and the substrate and the differences in the thermal coefficient of expansion between the film and the substrate. A thin amorphous buffer layer of BST has been used to relieve stress induced by the lattice mismatch between the film and the substrate. Unlike epitaxial films, stress relieved films do not show an inverse relationship between dielectric tuning and Q (1/tanδ) and may be superior materials for tunable microwave devices.
Starting Page	357
Ending Page	363
Page Count	7
File Format	PDF
ISSN	13853449
Journal	Journal of Electroceramics
Volume Number	4
Issue Number	2-3
e-ISSN	15738663
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2000-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Polymer Sciences Optical and Electronic Materials Characterization and Evaluation Materials Ceramics, Glass, Composites, Natural Methods Crystallography
Content Type	Text
Resource Type	Article
Subject	Ceramics and Composites Materials Chemistry Mechanics of Materials Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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