NDLI: Defect Chemistry of SrBi$_{2}$Ta$_{2}$O$_{9}$ and Ferroelectric Fatigue Endurance

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Defect Chemistry of SrBi$_{2}$Ta$_{2}$O$_{9}$ and Ferroelectric Fatigue Endurance

Content Provider	Springer Nature Link
Author	Palanduz, A.C. Smyth, D.M.
Copyright Year	2000
Abstract	The defect chemistry and charge transport properties of doped and undoped SrBi$_{2}$Ta$_{2}$O$_{9}$ (SBT) were studied by making 4-point dc equilibrium electrical conductivity, thermopower, ionic transport number, X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) measurements. Results of high temperature equilibrium dc conductivity, thermoelectric power, and transport number measurements as a function of oxygen activity in the temperature range 650–725°C revealed that undoped SBT displays a broad centrally located plateau of ionic conductivity with an activation energy of mobility of 0.94 eV and a prominent upturn at high oxygen activity, caused by p-type conductivity. The effects of acceptor and donor dopants are consistent with a 1–2% net acceptor excess in the undoped compound. It has been observed that there is substantial (several percent) cation place exchange between the Sr$^{2+}$ and Bi$^{3+}$ in SBT. It is proposed that the net acceptor excess in undoped SBT consists of disordered Sr$^{2+}$ substituting for Bi$^{3+}$ in the fluorite-like bismuth oxide layers which are locally compensated by oxygen vacancies. The formation of the net donor excess by disordered Bi$^{3+}$ substituting for Sr$^{2+}$ in the perovskite-like layers does not manifest itself as n-type conductivity behavior, because the band gap is large and the mobility is highly thermally activated. The superior intrinsic ferroelectric fatigue endurance of SBT is attributed to the lack of mobile charged defects in the perovkite-like layers which create the ferroelectric response of the compound. The metallic bismuth presence on the surface of undoped SBT, as revealed by qualitative XPS measurements, is believed to result from long exposure to the highly reducing conditions in the XPS system.
Starting Page	21
Ending Page	30
Page Count	10
File Format	PDF
ISSN	13853449
Journal	Journal of Electroceramics
Volume Number	5
Issue Number	1
e-ISSN	15738663
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2000-01-01
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Polymer Sciences Optical and Electronic Materials Characterization and Evaluation Materials Ceramics, Glass, Composites, Natural Methods Crystallography
Content Type	Text
Resource Type	Article
Subject	Ceramics and Composites Materials Chemistry Mechanics of Materials Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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