NDLI: Pulsed interferometric calorimetry

Content Provider	Springer Nature Link
Author	Maguv, A. N.
Copyright Year	2000
Abstract	The possibility of using semiconductor single crystals (Si, GaP, etc.) as calorimeters for pulsed heat flux measurements is discussed. The method of laser interferometric thermometry in the reflected light at a wavelength of 1.15 μm makes it possible to detect changes δθ≈2×10$^{−5}$ K in the temperature of a 1-mm-thick Si single crystal. The sensitivity of a calorimeter with laser readout is sufficient for detection of the absorbed energy δE≈15 μJ/cm$^{2}$ and is independent of the Si plate thickness. The method for selecting the working point in the resonance curve for achieving maximum sensitivity in detection of pulse fluxes is discussed.
Starting Page	582
Ending Page	584
Page Count	3
File Format	PDF
ISSN	00204412
Journal	Instruments and Experimental Techniques
Volume Number	43
Issue Number	4
e-ISSN	16083180
Language	English
Publisher	Nauka/Interperiodica
Publisher Date	2000-01-01
Publisher Place	Moscow
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Measurement Science, Instrumentation Electronic and Computer Engineering Physical Chemistry
Content Type	Text
Resource Type	Article
Subject	Instrumentation

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Pulsed interferometric calorimetry