NDLI: A four-segment photodiode cantilever-bending sensor for an atomic-force microscope

Content Provider	Springer Nature Link
Author	Kazantsev, D. V. Kazantzeva, E. A.
Copyright Year	2014
Abstract	An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever.
Starting Page	631
Ending Page	639
Page Count	9
File Format	PDF
ISSN	00204412
Journal	Instruments and Experimental Techniques
Volume Number	57
Issue Number	5
e-ISSN	16083180
Language	English
Publisher	Pleiades Publishing
Publisher Date	2014-09-23
Publisher Place	Moscow
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Measurement Science and Instrumentation Electrical Engineering Physical Chemistry
Content Type	Text
Resource Type	Article
Subject	Instrumentation

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