NDLI: Time tick based method for measuring static errors of ADC

Content Provider	Springer Nature Link
Author	Hariharan, K. Rajkumar, R. K. M. Abhaikumar, Dr. V.
Copyright Year	2011
Abstract	This paper presents a novel Time Tick based Built In Self Test (TT BIST) for measuring the static errors of an Analog to Digital Converter (ADC). The proposed method determines the period elapsed during transition between two consecutive digital levels and compares it with the ideal period of transition. A counter that works, at higher speed relative to the sampling rate of the ADC under test, is used. It counts the number of time ticks occurred during every transition. The required ramp signal is generated dynamically, using current source with digital switch for selecting the equivalent test signal. Further to support testing of errors in ratiometric ADC, a slope conditioning module is also implemented. The entire computation cycle is done in a single ramp cycle whereas in conventional histogram method multiple waveforms are required. Thus, the proposed TT method requires less time to achieve desired accuracy levels by choosing the appropriate slope of the ramp signal.
Starting Page	176
Ending Page	182
Page Count	7
File Format	PDF
ISSN	00204412
Journal	Instruments and Experimental Techniques
Volume Number	54
Issue Number	2
e-ISSN	16083180
Language	English
Publisher	SP MAIK Nauka/Interperiodica
Publisher Date	2011-04-20
Publisher Place	Dordrecht
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Electrical Engineering Measurement Science and Instrumentation Physical Chemistry
Content Type	Text
Resource Type	Article
Subject	Instrumentation

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