NDLI: Experimental Reconstruction of Thermal Parameters in CNT Array Multilayer Structure

Content Provider	Springer Nature Link
Author	Wang, Z. L. Li, Q. Tang, D. W.
Copyright Year	2011
Abstract	The thermal conductivities, thermal diffusivity, thermal anisotropy ratio, and thermal boundary resistance for the multilayered microstructure of a carbon nanotube (CNT) array are reconstructed experimentally using the 3ω method with two different width metal heaters. The thermal impedance in the frequency domain and sensitivity coefficients are introduced to simultaneously determine the multiple thermal parameters. The thermal conductivity at 295 K is 38 W · m$^{−1}$ · K$^{−1}$ along the nanotube growth direction, and two orders of magnitude lower in the direction perpendicular to the tubes with the anisotropy ratio as large as 86. Separation of the contact and CNT array resistances is realized through circuit modeling. The measured thermal boundary resistances of the CNT array/Si substrate and insulating diamond film interfaces are 3.1 m$^{2}$ · K · MW$^{−1}$ and 18.4 m$^{2}$ · K · MW$^{−1}$, respectively. The measured thermal boundary resistance between the heater and diamond film is 0.085 m$^{2}$ · K · MW$^{−1}$ using a reference sample without a CNT array. The thermal conductivity for a CNT array already exceeds those of phase-changing thermal interface materials used in microelectronics.
Starting Page	1013
Ending Page	1024
Page Count	12
File Format	PDF
ISSN	0195928X
Journal	International Journal of Thermophysics
Volume Number	32
Issue Number	5
e-ISSN	15729567
Language	English
Publisher	Springer US
Publisher Date	2011-04-19
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	3ω Method Carbon nanotube array Thermal boundary resistance Thermal conductivity Thermal impedance Mechanics Industrial Chemistry/Chemical Engineering Physical Chemistry Condensed Matter Physics
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics

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