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| Content Provider | Springer Nature Link |
|---|---|
| Author | White, D. R. Jongenelen, C. L. Saunders, P. |
| Copyright Year | 2010 |
| Abstract | Hysteresis in industrial platinum resistance thermometers (IPRT) is caused by tension and compression induced in the wire due to differential thermal expansion of the platinum wire and the substrate. This article reports the measurement of hysteresis in a wide range of IPRTs including thin-film, glass-encapsulated, ceramic-encapsulated, and low-hysteresis partially-supported sensors, over the temperature range from −20 °C to 180 °C. The study confirms previous findings that the amount of hysteresis is very dependent on the design of the sensing element and the temperature range. In addition, some sensors exhibit a large change in resistance on first use, whereas others showed a slow increase in resistance with use. The observed hysteresis ranged between 0.2 % of the temperature range for one glass-encapsulated sensor and 0.002 % for the best of the partially-supported ceramic sensors. |
| Starting Page | 1676 |
| Ending Page | 1684 |
| Page Count | 9 |
| File Format | |
| ISSN | 0195928X |
| Journal | International Journal of Thermophysics |
| Volume Number | 31 |
| Issue Number | 8-9 |
| e-ISSN | 15729567 |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2010-09-19 |
| Publisher Place | Boston |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Hysteresis Industrial platinum resistance thermometer Physical Chemistry Mechanics Condensed Matter Physics Industrial Chemistry/Chemical Engineering |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics |
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