NDLI: Measurements of the seebeck coefficient of thermoelectric materials by an AC method

Content Provider	Springer Nature Link
Author	Goto, T. Li, J. H. Hirai, T. Maeda, Y. Kato, R. Maeso, A.
Copyright Year	1997
Abstract	An ac method for measurement of the Seebeck coefficient was developed. Specimens were heated periodically at frequencies in the range 0.2 10 Hz using a semiconductor laser. The small temperature increase and the resultant thermoelectric power were measured with a Pt Pt 13% Rh thermocouple (25 μm in diameter) through a lock-in amplifier. The Seebeck coefficient of a Pt$_{90}$Rh$_{10}$ foil measured by the ac method was in agreement with that obtained from the standard table. The optimum frequency and specimen thickness for the ac method were 0.2 Hz and 0.1 0.2 mm, respectively. The Seebeck coefficients of silicon single crystal and several thermoelectric semiconductors (Si$_{80}$Ge$_{20}$, PbTe, FeSi$_{2}$, SiB$_{14}$) measured by the ac method agreed with those measured by a conventional de method in the temperature range between room temperature and 1200 K. The time needed for each measurement was less than a few tens of minutes, significantly shorter than that for a conventional de method.
Starting Page	569
Ending Page	577
Page Count	9
File Format	PDF
ISSN	0195928X
Journal	International Journal of Thermophysics
Volume Number	18
Issue Number	2
e-ISSN	15729567
Language	English
Publisher	Kluwer Academic Publishers-Plenum Publishers
Publisher Date	1997-01-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	ac method platinum rhodium alloy Seebeck coefficient semiconductors silicon germanium alloy thermoelectricity Physical Chemistry Industrial Chemistry/Chemical Engineering Mechanics Condensed Matter
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics

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