NDLI: An improved compact model of the electrical behaviour of the 5-contact vertical Hall-effect device

Content Provider	Springer Nature Link
Author	Madec, Morgan Schell, Jean Baptiste Kammerer, Jean Baptiste Lallement, Christophe Hébrard, Luc
Copyright Year	2014
Abstract	This paper presents the improvement of an existing design-oriented compact model of the 5-contact vertical Hall-effect sensor integrated in CMOS technology. Such a model should facilitate the work of designers, permitting them to simulate the sensor, the biasing and processing electronics together with the same electrical simulator. Focus is put on the main aspects that alter the electrical response of the sensor: modulation of the conduction channel due to the bias-dependent space charge region thickness, saturation of carrier velocity, asymmetries, and effective channel conduction thickness. The model has been achieved with a subtle mix of theoretical considerations, numerical simulations performed with COMSOL Multiphysics® and experimental data. The parameters extraction procedure is also discussed. The model has been validated on experimental data gathered from two devices, one fabricated in a low-voltage CMOS technology and the other one in a high-voltage CMOS technology. Then, the model is used in order to study offset issues in VHD with external measurement contacts, i.e. VHD integrated in the shallow N-well of low-voltage technologies, and the way the spinning current technique can be used to suppress this offset. A new spinning-current technique is proposed for such a VHD. The simulation results are in perfect accordance with the analytical study. They pave the way for the design of an optimized readout circuitry that may improve the sensor sensitivity while maintaining a very low offset.
Starting Page	677
Ending Page	691
Page Count	15
File Format	PDF
ISSN	09251030
Journal	Analog Integrated Circuits and Signal Processing
Volume Number	81
Issue Number	3
e-ISSN	15731979
Language	English
Publisher	Springer US
Publisher Date	2014-11-28
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Vertical Hall-effect device Compact modeling VHDL-AMS Spinning-current Circuits and Systems Electrical Engineering Signal, Image and Speech Processing
Content Type	Text
Resource Type	Article
Subject	Surfaces, Coatings and Films Signal Processing Hardware and Architecture

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