NDLI: Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology

Content Provider	Springer Nature Link
Author	Tadeusiewicz, Michał Hałgas, Stanisław
Copyright Year	2016
Abstract	This paper is devoted to local multiple soft fault diagnosis of nonlinear DC analog CMOS circuits designed in nanometer technology. An algorithm is developed that allows estimating the values of a set of potentially faulty process parameters. It exploits two tests with the input nodes accessible for excitation and the output node accessible for measurement. One of the tests is used to find the parameter values. It leads to a system of nonlinear algebraic type equations that are not given in explicit analytical form and may be satisfied by several sets of the parameter values. To solve the system of the equations the Nelder–Mead optimization method is applied with the objective function properly modified during the computation process. Next the obtained solution, being a set of the parameter values, is validated using the other test. If the solution passes this test it is considered as the actual one. Otherwise, another solution is calculated and verified using the same approach. The developed diagnostic procedure has been implemented in DELPHI, whereas the required by the algorithm circuit analyses are performed using IsSPICE 4 and both environments have been joined together. For illustration three numerical examples are given.
Starting Page	65
Ending Page	77
Page Count	13
File Format	PDF
ISSN	09251030
Journal	Analog Integrated Circuits and Signal Processing
Volume Number	88
Issue Number	1
e-ISSN	15731979
Language	English
Publisher	Springer US
Publisher Date	2016-05-06
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Analog nonlinear circuits Fault diagnosis Multiple soft faults Nanometer technology Nelder–Mead method Circuits and Systems Electrical Engineering Signal, Image and Speech Processing
Content Type	Text
Resource Type	Article
Subject	Surfaces, Coatings and Films Signal Processing Hardware and Architecture

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