NDLI: Pressure field evaluation in microchannel junction flows through μPIV measurement

Content Provider	Springer Nature Link
Author	Fujisawa, N. Nakamura, Y. Matsuura, F. Sato, Y.
Copyright Year	2006
Abstract	An experimental method for evaluating pressure fields in a microchannel flow was studied using μPIV measurement in conjunction with the pressure Poisson equation. The pressure error due to the influence of numbers of measurement planes, computational grids for solving pressure Poisson equation, and an experimental error in μPIV measurement was evaluated with respect to the exact solution of Navier–Stokes equation for straight microchannel flow. The mean velocity field in microchannel junction flows with bifurcation and confluence was measured by a μPIV system, which consists of a CCD camera and a microscope with an in-line illumination of white light from stroboscopes. The planar velocity fields at various cross-sections of the microchannel flow were measured by traversing the focal plane within a depth of focus of the microscope. The pressure contour in the microchannel flow was evaluated by solving the pressure Poisson equation with the experimental velocity data. The results indicate that the pressure field in the microchannel junction flow agrees closely with the numerical simulation of laminar channel flow, which suggests the validity of the present method.
Starting Page	447
Ending Page	453
Page Count	7
File Format	PDF
ISSN	16134982
Journal	Microfluidics and Nanofluidics
Volume Number	2
Issue Number	5
e-ISSN	16134990
Language	English
Publisher	Springer-Verlag
Publisher Date	2006-03-31
Publisher Place	Berlin, Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Microfluid Measurement μPIV Pressure Velocity Engineering Thermodynamics, Transport Phenomena Engineering Fluid Dynamics Mechanics, Fluids, Thermodynamics Nanotechnology Polymer Sciences Medical Microbiology
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Materials Chemistry Condensed Matter Physics Electronic, Optical and Magnetic Materials

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