NDLI: Full field measurement at the micro-scale using micro-interferometry

Content Provider	Springer Nature Link
Author	Garvey, Julie Newport, David Lakestani, Fereydoun Whelan, Maurice Joseph, Shiju
Copyright Year	2007
Abstract	This paper presents micro-interferometry as a measurement technique to extract temperature profiles and/or mass transfer gradients rapidly and locally in micro-devices. Interferometry quantifies the phase change between two or more coherent light beams induced by temperature and/or mass concentration. Previous work has shown that temporal noise is a limiting factor in microscale applications. This paper examines phase stepping and heterodyne phase retrieval techniques with both CCD and CMOS cameras. CMOS cameras are examined owing to the high speed at which images can be acquired which is particularly relevant to heterodyne methods. It is found that heterodyne retrieval is five times better than phase stepping being limited to 0.01 rad or λ/628. This is twice the theoretical limit of λ/1,000. The technique is demonstrated for mixing in a T-junction with a 500 μm square channel and compared favourably to a theoretical prediction from the literature. Further issues regarding application to temperature measurements are discussed.
Starting Page	77
Ending Page	87
Page Count	11
File Format	PDF
ISSN	16134982
Journal	Microfluidics and Nanofluidics
Volume Number	5
Issue Number	1
e-ISSN	16134990
Language	English
Publisher	Springer-Verlag
Publisher Date	2007-10-12
Publisher Place	Berlin, Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Phase stepping Heterodyne technique Phase Micro-channel CMOS camera Micro-mixing Engineering Thermodynamics, Transport Phenomena Mechanics, Fluids, Thermodynamics Nanotechnology Polymer Sciences Medical Microbiology Engineering Fluid Dynamics
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Materials Chemistry Condensed Matter Physics Electronic, Optical and Magnetic Materials

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