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| Content Provider | Springer Nature Link |
|---|---|
| Author | Yoshida, Kenichiro |
| Copyright Year | 2016 |
| Abstract | We derived the absorption coefficient (μ a) and the reduced scattering coefficient (μ s′) using the edge-loss method (ELM) and the video reflectometry method (VRM), and compared the results. In a previous study, we developed the ELM to easily evaluate the lateral spread in the skin; the VRM is a conventional method. The ELM measures the translucency index, which is correlated with μ a and μ s′. To obtain a precise estimation of these parameters, we improved the treatment of a white standard and the surface reflection. For both skin phantoms and actual skin, the values for μ a and μ s′ that we obtained using the ELM were similar to those obtained using the VRM, when μ a/μ s′ was less than or equal to 0.05 and the diffusion approximation was applicable. Under this condition, the spectral reflectivity is greater than 0.4. In this study, we considered wavelengths longer than 600 nm for Types III and IV of the Fitzpatrick scale. For skin, the repeatability errors of the parameters obtained with the ELM were smaller than those obtained with the VRM; this can be an advantage in field tests. |
| Starting Page | 579 |
| Ending Page | 586 |
| Page Count | 8 |
| File Format | |
| ISSN | 13406000 |
| Journal | Optical Review |
| Volume Number | 23 |
| Issue Number | 4 |
| e-ISSN | 13499432 |
| Language | English |
| Publisher | Springer Japan |
| Publisher Date | 2016-07-05 |
| Publisher Place | Tokyo |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Translucency Absorption coefficient Reduced scattering coefficient Edge loss Diffuse reflectance Skin tissue Optics, Optoelectronics, Plasmonics and Optical Devices Atomic, Molecular, Optical and Plasma Physics Quantum Optics Microwaves, RF and Optical Engineering |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics |
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