NDLI: Incident-angle-dependent reflectance in distributed Bragg reflectors fabricated from ZnO/MgO multilayer films

Content Provider	Springer Nature Link
Author	Huang, Ying Shin Hu, Sheng Yao Huang, Chia Chih Lee, Yueh Chien Lee, Jyh Wei Chang, Chung Cheng Wun, Zin Kuan Tiong, Kwong Kau
Copyright Year	2014
Abstract	We present the incident-angle-dependent reflectance spectra of the 10-period ZnO/MgO multilayer films deposited on Si by sputtering technique. As increasing the incident angle, the resonant wavelength and bandwidth of the measured reflectance spectra exhibit redshift and narrower, respectively. The theoretical curves using transfer matrix method taken account of transverse electric (TE) and transverse magnetic (TM) polarizations are calculated to well describe the variations in the behavior of the experimental spectra. The simulated TE- and TM-reflection band at different angles can evaluate the bandwidth of the resonance band and provide valuable parameters to design an omnidirectional-reflection band in selected multilayer structure.
Starting Page	651
Ending Page	654
Page Count	4
File Format	PDF
ISSN	13406000
Journal	Optical Review
Volume Number	21
Issue Number	5
e-ISSN	13499432
Language	English
Publisher	The Optical Society of Japan
Publisher Date	2014-10-03
Publisher Place	Japan
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	zinc oxide distributed Bragg reflectors reflectance sputtering Physics
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics

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Incident-angle-dependent reflectance in distributed Bragg reflectors fabricated from ZnO/MgO multilayer films