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| Content Provider | Springer Nature Link |
|---|---|
| Author | Wang, Chuangye Morgner, Harald |
| Copyright Year | 2010 |
| Abstract | Angular resolved X-ray photoelectron spectroscopy (ARXPS) has been applied to obtain the distribution of chemical elements near the surface of non-aqueous solutions containing surfactants. However, such profiles can only yield a quantitative relation between those constituents near the surface regime of sample. With the knowledge of the molar volumes of surfactant and solvent, we have obtained the molar concentration-depth profiles via the molar fraction-depth profiles that were reconstructed by ARXPS with the help of a generic algorithm. The concentration profiles show detailed distributions of the surfactant ions near the surface, which provide a direct insight into the surface picture of the surfactant solution. The surface active cations and counter-ions have significantly different distributions near the solution surface. |
| Starting Page | 415 |
| Ending Page | 422 |
| Page Count | 8 |
| File Format | |
| ISSN | 00263672 |
| Journal | Microchimica Acta |
| Volume Number | 171 |
| Issue Number | 3-4 |
| e-ISSN | 14365073 |
| Language | English |
| Publisher | Springer Vienna |
| Publisher Date | 2010-09-17 |
| Publisher Place | Vienna |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Angular resolved X-ray photoelectron spectroscopy Cationic surfactant solution Molar fraction-depth profile Molar concentration-depth profile Microengineering Analytical Chemistry Characterization and Evaluation of Materials Nanotechnology Nanochemistry |
| Content Type | Text |
| Resource Type | Article |
| Subject | Analytical Chemistry |
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