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| Content Provider | Springer Nature Link |
|---|---|
| Author | Chuang, Cheng Hsin Li, Wen Hui Lee, Shin Li |
| Copyright Year | 2010 |
| Abstract | A backside-etched silicon chip with a polysilicon diaphragm flip-chip attached on a printed wiring board and globally bumped on a FR4 printed circuit board was investigated through a finite element analysis for determining three key parameters of flip-chip chip size packaging, namely, the size of solder bump, and the thickness of the printed wiring board with/without U8437-3 underfill. Four kinds of thermal-induced stresses and deformations in the diaphragm, solder bump, and printed wiring board were evaluated for the parametric study. As the simulation results show, the thermal-induced stresses in the diaphragm and solder bump can be reduced effectively if the printed wiring board is thinner. However, the printed wiring board is still required to be sufficiently thick to prevent warping. In addition, the underfill material also can reduce the induced stress occurring at the interface between the solder joint and the chip and improve reliability. In general, the parametric study can provide a basis for the flip chip package of a MEMS device with a diaphragm, such as a MEMS microphone, MEMS pressure sensor, etc. |
| Starting Page | 669 |
| Ending Page | 675 |
| Page Count | 7 |
| File Format | |
| ISSN | 09467076 |
| Journal | Microsystem Technologies |
| Volume Number | 17 |
| Issue Number | 4 |
| e-ISSN | 14321858 |
| Language | English |
| Publisher | Springer-Verlag |
| Publisher Date | 2010-12-24 |
| Publisher Place | Berlin, Heidelberg |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Electronics and Microelectronics, Instrumentation Mechanical Engineering Nanotechnology |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nanoscience and Nanotechnology Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering Hardware and Architecture |
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