NDLI: Theoretical study of van der Waals dispersion pressures considering one-dimensional material distributions in the in-plane direction

Content Provider	Springer Nature Link
Author	Matsuoka, Hiroshige Kitahama, Niki Tanaka, Teppei Fukui, Shigehisa
Copyright Year	2014
Abstract	The van der Waals dispersion pressures between a half-space consisting of a uniform material and a half-space with a one-dimensional material distribution in the in-plane direction have been theoretically derived. Two patterns of material distribution were considered: a periodic distribution of materials (Pattern 1) and a distribution of two materials with a single interface (Pattern 2). The van der Waals pressure for Pattern 1 was derived based on a Fourier series, while the van der Waals pressure for Pattern 2 was derived as elementary functions. Both of the van der Waals pressures derived consist of two terms: a conventional term between half-spaces made of uniform materials and a spatial fluctuation term due to the material distribution. The basic characteristics of these van der Waals pressures were quantitatively clarified. Furthermore, an approximate method for obtaining the van der Waals pressure of Pattern 1 from Pattern 2 was proposed.
Starting Page	1397
Ending Page	1403
Page Count	7
File Format	PDF
ISSN	09467076
Journal	Microsystem Technologies
Volume Number	20
Issue Number	8-9
e-ISSN	14321858
Language	English
Publisher	Springer Berlin Heidelberg
Publisher Date	2014-03-30
Publisher Place	Berlin, Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Electronics and Microelectronics, Instrumentation Nanotechnology Mechanical Engineering
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering Hardware and Architecture

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