NDLI: Failure of electronic devices due to condensation

Content Provider	Springer Nature Link
Author	Schimpf, C. Feldmann, K. Matzner, C. Steinke, A.
Copyright Year	2008
Abstract	The increasing usage of electronic devices and the progressive trend of miniaturisation in automotive applications require different installation locations. According to varying locations, different climate conditions will occur. In this article, the influence of condensation on the reliability of electronic devices is examined. For the detection of failures or the loss of functionality it is essential to determine the occurrence of condensation. A new microsensor based on the CCC-principle (condensate controlled capacitance) allows the measurement of the condensed water mass directly. Depending on the gaps of special designed stray field capacity in combination with a water drop sensitive detection system, a change of the capacity with increasing water mass is shown. It is necessary to analyse failure mechanisms like corrosion induced leakage currents and electrochemical migration. For the research of these failure mechanisms special test patterns were designed and assembled. These samples were exposed to a certain climate profile, which produces a reproducible and defined amount of condensation, this can occur in certain locations in automotives. On the bases of these test patterns, which consist of both combs with different spaces and chip capacities with variable sizes, diverse influences were examined. Beside field strength also the surface metallisation and the cleanliness of the samples were investigated and quantified.
Starting Page	123
Ending Page	127
Page Count	5
File Format	PDF
ISSN	09467076
Journal	Microsystem Technologies
Volume Number	15
Issue Number	1
e-ISSN	14321858
Language	English
Publisher	Springer-Verlag
Publisher Date	2008-06-06
Publisher Place	Berlin, Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Mechanical Engineering Nanotechnology Electronics and Microelectronics, Instrumentation
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering Hardware and Architecture

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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