NDLI: Nondestructive evaluation of nanoscale structures: inverse scattering approach

Content Provider	Springer Nature Link
Author	Pan, Li Chen, Xudong Yeo, Swee Ping
Copyright Year	2010
Abstract	In this paper, we demonstrate how subwavelength images of nanoscale structures can be obtained from the measurements of electromagnetic fields scattered by the objects, via an enhanced inverse scattering approach, which takes into account the multiple-scattering effect and allows the detectors to be placed in the far field. Specifically, the method is a combination of the transverse electric (TE) incidence and the subspace-based optimization method (SOM). It is observed that a wide continuous range of integer values of leading singular values can yield satisfactory reconstruction results, and even if the antennas for radiating and receiving the electromagnetic wave can only be arranged on one side of the scatterers, due to the limitation in the real world, the proposed method is still capable of achieving high resolution for the reconstructed patterns with rapid convergence rates and robust immunity to high noise corruption (33%).
Starting Page	143
Ending Page	146
Page Count	4
File Format	PDF
ISSN	09478396
Journal	Applied Physics A
Volume Number	101
Issue Number	1
e-ISSN	14320630
Language	English
Publisher	Springer-Verlag
Publisher Date	2010-05-29
Publisher Place	Berlin, Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Operating Procedures, Materials Treatment Surfaces and Interfaces, Thin Films Characterization and Evaluation of Materials Nanotechnology Optical and Electronic Materials Condensed Matter Physics
Content Type	Text
Resource Type	Article
Subject	Chemistry Materials Science

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