NDLI: Phase transformation of Ni/Si thin films induced by nanoindentation and annealing

Content Provider	Springer Nature Link
Author	Lee, Woei Shyan Chen, Tao Hsing Lin, Chi Feng Chen, Jyun Ming
Copyright Year	2010
Abstract	Thin Ni/Si films are prepared by depositing a Ni layer with a thickness of 100 nm on a Si (100) substrate. The as-deposited thin-film specimens are indented to a maximum depth of 500 nm using a nanoindentation technique and are then annealed at temperatures of 200°C, 300°C, 500°C and 800°C for 2 min. The microstructural changes and phases induced in the various specimens are observed using transmission electron microscopy (TEM) and micro-Raman scattering spectroscopy (RSS). Based on the load-displacement data obtained in the nanoindentation tests, the hardness and Young’s modulus of the as-deposited specimens are found to be 13 GPa and 177 GPa, respectively. The microstructural observations reveal that the nanoindentation process prompts the transformation of the indentation-affected zone of the silicon substrate from a diamond cubic structure to a mixed structure comprising amorphous phase and metastable Si III and Si XII phases. Following annealing at temperatures of 200∼500°C, the indented zone contains either a mixture of amorphous phase and Si III and Si XII phases, or Si III and Si XII phases only, depending on the annealing temperature. In addition, the annealing process prompts the formation of nickel silicide phases at the Ni/Si interface or within the indentation zone. The composition of these phases depends on the annealing temperature. Specifically, Ni2Si is formed at a temperature of 200°C, NiSi is formed at a temperature of 300°C and 500°C, and NiSi2 is formed at 800°C.
Starting Page	1089
Ending Page	1096
Page Count	8
File Format	PDF
ISSN	09478396
Journal	Applied Physics A
Volume Number	100
Issue Number	4
e-ISSN	14320630
Language	English
Publisher	Springer-Verlag
Publisher Date	2010-05-06
Publisher Place	Berlin, Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Operating Procedures, Materials Treatment Surfaces and Interfaces, Thin Films Characterization and Evaluation of Materials Nanotechnology Optical and Electronic Materials Condensed Matter Physics
Content Type	Text
Resource Type	Article
Subject	Chemistry Materials Science

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