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| Content Provider | Springer Nature Link |
|---|---|
| Author | Han, Yong Hee Ko, Sung Seok |
| Copyright Year | 2011 |
| Abstract | This paper discusses characteristics unique in the two-phase high-frequency-testing (HFT) environment in semiconductor manufacturing. We believe this paper is the first to define, formalize, and analyze the decision making problem associated with the two-phase HFT. Specifically, this paper defines the problem of minimizing the total HFT capacity usage by systematically finding the optimal number of preliminary HFT bin-1 chips subject to the main HFT, with the existence of the target service rate. We also propose a heuristic algorithm that exploits the special structure of the problem for efficiently obtaining a near-optimal solution. Finally, a numerical analysis and a case study have been conducted to gain more insights on the problem structure and the proposed algorithm. |
| Starting Page | 213 |
| Ending Page | 220 |
| Page Count | 8 |
| File Format | |
| ISSN | 02683768 |
| Journal | The International Journal of Advanced Manufacturing Technology |
| Volume Number | 62 |
| Issue Number | 1-4 |
| e-ISSN | 14333015 |
| Language | English |
| Publisher | Springer-Verlag |
| Publisher Date | 2011-12-02 |
| Publisher Place | London |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | High-frequency testing Binning Substitution Downgrading Semiconductor test Production/Logistics/Supply Chain Mechanical Engineering Industrial and Production Engineering Computer-Aided Engineering (CAD, CAE) and Design |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Mechanical Engineering Computer Science Applications Software |
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