NDLI: Surface probing simulator for the evaluation of CMM probe radius correction software

Content Provider	Springer Nature Link
Author	Erkan, Tibet Mayer, René Woźniak, Adam
Copyright Year	2010
Abstract	Scanning coordinate metrology is largely based on recording the position of a spherical tip which is maintained in contact with the surface to be measured. The coordinate measuring machine (CMM) software converts these tip coordinates into coordinates of points on the measured surface, a process called probe radius correction. In order to investigate the probe radius correction accuracy of specific CMM software in scanning measurements, a surface probing simulator is developed. It calculates the coordinates of probe tip center points (virtual indicated measured points) as raw measurement data by numerically probing a known virtual surface. An iterative solution based on geometric criteria is used to achieve the necessary tangential contact conditions. Various sculptured surface profiles, probe radii, and scanning increments can then be simulated. These raw data are then fed to the CMM software where the probe radius correction is performed. The CMM results are then compared with the known surface to evaluate the probe radius correction accuracy of the CMM built-in algorithm. The simulator allows a rapid CMM software capability check for a variety of situations and may pinpoint shortfalls that may be avoided through alternative measurement procedures. It may also be used to motivate the development of new probe radius correction techniques and assist in their evaluation. Tests were conducted on a Zeiss and a Mitutoyo CMM to demonstrate the usefulness of the simulator.
Starting Page	307
Ending Page	315
Page Count	9
File Format	PDF
ISSN	02683768
Journal	The International Journal of Advanced Manufacturing Technology
Volume Number	55
Issue Number	1-4
e-ISSN	14333015
Language	English
Publisher	Springer-Verlag
Publisher Date	2010-12-04
Publisher Place	London
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Coordinate measuring machine Simulation Probe radius correction Scanning Contact metrology Industrial and Production Engineering Computer-Aided Engineering (CAD, CAE) and Design Mechanical Engineering Production/Logistics
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Mechanical Engineering Computer Science Applications Software

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Stylus tip envelop method: corrected measured point determination in high definition coordinate metrology

Mobile spatial coordinate measuring system (MScMS) and CMMs: a structured comparison

Isoplanar-based adaptive sampling for model-unknown sculptured surface coordinate metrology using non-contact probe

Five-axis automated measurement by coordinate measuring machine

A novel moiré-based optical scanning head for high-precision contouring

Feature-based design approach for integrated CAD and computer-aided inspection planning

New method of testing of the repeatability of CMM articulating heads

Measuring external profiles of porous objects using CMM

Modelling of pretravel for touch trigger probes on indexable probe heads on coordinate measuring machines

Surface probing simulator for the evaluation of CMM probe radius correction software

Similar Documents

Stylus tip envelop method: corrected measured point determination in high definition coordinate metrology

Mobile spatial coordinate measuring system (MScMS) and CMMs: a structured comparison

Isoplanar-based adaptive sampling for model-unknown sculptured surface coordinate metrology using non-contact probe

Five-axis automated measurement by coordinate measuring machine

A novel moiré-based optical scanning head for high-precision contouring

Feature-based design approach for integrated CAD and computer-aided inspection planning

New method of testing of the repeatability of CMM articulating heads

Measuring external profiles of porous objects using CMM

Modelling of pretravel for touch trigger probes on indexable probe heads on coordinate measuring machines

Surface probing simulator for the evaluation of CMM probe radius correction software