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Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy
| Content Provider | Springer-eBooks |
|---|---|
| Author | Voigtländer, Bert |
| Copyright Year | 2015 |
| Abstract | This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. |
| File Format | |
| ISBN | 9783662452400 |
| Language | English |
| Publisher | SpringerLink Springer eBooks |
| Access Restriction | Subscribed |
| Subject Keyword | Materials Science Nanotechnology Nanotechnology and Microengineering Condensed Matter Physics |
| Content Type | Text |
| Resource Type | Book |