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Investigation of the Statistical surface morphology and optical properties of the Ag / Al and Ag / Cu thin double-layers
| Content Provider | Semantic Scholar |
|---|---|
| Author | Zendehnam, Akbar Farokhi, Babak Beiranvand, N. Miri, S. Hashem |
| Copyright Year | 2013 |
| Abstract | In this work, thin films were deposited on the amorphous glass substrates by magnetron sputtering method. Surface morphology of double-layers of Ag/Al and Ag/Cu were investigated. For surface morphology studies atomic force microscope (AFM) and scanning electron microscopy (SEM) were used, variations of the grain and partical size as well as surface roughness, roughness exponents and correlation length were studied for double layers. Coating Cu and Al on silver thin films reduces the surface roughness and correlation length but when Ag is deposited on Al and Cu correlation length increases. The reflectance is measured in wavelength range of 200-1100 nm, and deposition of Cu and Al thin films on Ag film causes variation on the amount of the reflectance drastically. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://naturalspublishing.com/files/published/n43929mj3z7lta.pdf |
| Alternate Webpage(s) | http://www.naturalspublishing.com/files/published/n43929mj3z7lta.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | 3D film Aluminum Aluminum measurement Atomic-force microscopy Attoliter Copper measurement Dip-coating Galaxy morphological classification Height Mathematical morphology Microscope Device Component Microscopy, Atomic Force Physical vapor deposition Scanning Electron Microscopy Scanning Probe Microscopes (device) Silver Sputter deposition Thickness (graph theory) Thin-film transistor Tree rearrangement alanylglutamine anatomical layer wavelength |
| Content Type | Text |
| Resource Type | Article |
