NDLI: Time of flight secondary ion mass spectrometry (ToF-SIMS)

Content Provider	Semantic Scholar
Author	Bertrand, Patrick Weng, Lu-Tao
Copyright Year	1996
Abstract	Secondary ion mass spectrometry in the “static mode” is becoming a key technique for the surface characterization of organic materials. This is due to the very specific chemical information derived from characteristic molecular secondary ions. The present expansion of this technique is related to the development of high performance time-of-flight mass spectrometers. Indeed they combine high mass resolution allowing to resolve mass interferences between isobaric molecular secondary ions, unlimited mass range, high transmission allowing to reduce the total ion fluence per spectrum (< 1012 ions/cm2) and the molecular imaging capabilities in microscope and/or microprobe modes.
Starting Page	167
Ending Page	182
Page Count	16
File Format	PDF HTM / HTML
DOI	10.1007/978-3-7091-6555-3_8
Volume Number	13
Alternate Webpage(s)	http://www.uni-leipzig.de/~diff/journal/pdf/volume12/diff_fund_12(2010)52.pdf
Alternate Webpage(s)	http://www.uni-leipzig.de/diffusion/journal/pdf/volume12/diff_fund_12(2010)52.pdf
Alternate Webpage(s)	http://www.qucosa.de/fileadmin/data/qucosa/documents/18686/diff_fund_12(2010)52.pdf
Alternate Webpage(s)	http://www.uni-leipzig.de/diffusion/pdf/volume12/diff_fund_12(2010)52.pdf
Alternate Webpage(s)	https://www.scas.co.jp/technical-informations/technical-news/pdf/tn288.pdf
Alternate Webpage(s)	http://www.uni-leipzig.de/~diff/pdf/volume12/diff_fund_12(2010)52.pdf
Alternate Webpage(s)	https://doi.org/10.1007/978-3-7091-6555-3_8
Language	English
Access Restriction	Open
Content Type	Text
Resource Type	Article

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