NDLI: Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

Please wait, while we are loading the content...

Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

Content Provider	Semantic Scholar
Author	Kruk, Aleksandra Cempura, Grzegorz Penkalla, H. J. Thomser, C. Czyrska-Filemonowicz, Aleksandra
Copyright Year	2011
Abstract	Tungsten and its alloys are considered as structural materials for plasma-facing applications. The divertor design requires a material with a low ductile–brittle transition temperature and a recrystallization temperature (TR) of about 1570 K. One of the materials under consideration is W–1.7%TiC. The aim of this work was to perform a detailed microstructural characterization of the two materials, pure W and W–1.7%TiC alloy, by electron microscopy and a new technique, electron tomography. Thin foil preparation for transmission electron microscopy investigation of W-based materials is extremely difficult. After many trials by various techniques, a method for thin foil preparation was successfully elaborated and a transmission electron microscope (TEM) investigation was carried out. A pure tungsten specimen was investigated as a reference material. The application of TEM and focused ion beam–scanning electron microscopy techniques enables the identification of some creep-induced features in pure tungsten and the determination of the size and morphology of three-dimensional pores and particles in W–TiC-based alloy. PACS number: 28.52.Fa
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://s3.amazonaws.com/zanran_storage/iopscience.iop.org/ContentPages/2538636067.pdf
Language	English
Access Restriction	Open
Subject Keyword	Alloys Behavioral tic Biological specimen CDISC SEND Biospecimens Terminology Electron Probe Microanalysis Electron tomography Focused ion beam Foil Device Component Galaxy morphological classification Instruction creep Ions Microscope Device Component Physics and Astronomy Classification Scheme Plasma Active Transistor Transmission Electron Microscopes Transmission Electron Microscopy tungsten
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in