Loading...
Please wait, while we are loading the content...
Advancing In situ Analytical Electron Microscopy for Probing Dynamic Nano-Scale Solid State Electrochemistry
| Content Provider | Semantic Scholar |
|---|---|
| Author | Meng, Ying Shirley |
| Copyright Year | 2017 |
| Abstract | In situ analytical electron microscopy (AEM) is a fast-growing and fascinating area of research that has drawn tremendous attention from various fields ranging from materials science to chemistry and biology. In fundamental studies of energy storage system, particularly electrochemical energy storage (EES), ex situ experiments often have limited time-scale resolution due to sample preparation and transfer, preventing the determination of the time constant of a reaction/transformation. More importantly, electrochemical systems often operate at states far from equilibrium. On the other hand, the EES systems’ macroscopic properties such as the energy and power density are often governed the electrode/electrolyte interfaces that by nature are of atomic and nano scales. Therefore, in situ AEM provides great opportunities to characterize dynamic changes in morphology, electronic bonding state, and chemical composition in materials at and below the nanoscale. In situ electrochemical operation in the ultra-high vacuum column of a TEM has been pursued by three major strategies (Fig. 1). Our team has focused on the solid state approach (2 in Fig.1), where a full cell “nanobattery” can be fabricated from an all-solid-state thin film battery using a set of fully optimized focused ion beam (FIB) fabrication procedure. |
| Starting Page | 1962 |
| Ending Page | 1963 |
| Page Count | 2 |
| File Format | PDF HTM / HTML |
| DOI | 10.1017/s1431927617010479 |
| Volume Number | 23 |
| Alternate Webpage(s) | http://minisites.cambridgecore.org/MAM2017/7337/1962.pdf |
| Alternate Webpage(s) | https://doi.org/10.1017/s1431927617010479 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |