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sistive memory e ff ect in 2 , 2 0 , 6 , 6 0-tetraphenyl-dipyranylidene thin fi lms as observed in fi eld-e ff ect transistors and by conductive atomic force microscopy †
| Content Provider | Semantic Scholar |
|---|---|
| Author | Courté, Marc Surya, Sandeep Goud Thamankar, R. Shen, Chao Rao, V. Ramgopal Mhailsalkarde, Subodh G. Fichou, Denis |
| Copyright Year | 2017 |
| Abstract | School of Physical and Mathematical Scie 637371, Singapore. E-mail: denischou@nt Department of Electrical Engineering, In Mumbai 400 076, India School of Engineering and Technology, CM School of Material Science and Engineer 639798, Singapore Energy Research Institute@NTU (ERI@N 637141, Singapore CNRS, UMR 8232, Institut Parisien de Chim Sorbonne Universités, UPMC Univ Paris 06 Moléculaire, F-75005, Paris, France † Electronic supplementary informa 10.1039/c6ra26876e ‡ These authors contributed equally. Cite this: RSC Adv., 2017, 7, 3336 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://pubs.rsc.org/en/content/articlepdf/2017/ra/c6ra26876e |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |